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SRAM IDT7026 SEU Prediction and On-Orbit Validation

Jingjing Li, Sipei Shao, Xiaoyun Hao, Yong Liu, and Yutu Zhang
Shandong Aerospace Electro-Technology Institute, Yantai, China
Abstract—Single Event Effect (SEE) prediction and validation is important for low cost electronic parts on-orbit application. As the SRAM IDT7026 has no space radiation-resistant measures, there are SEE risks when it is applied in aerospace activities. In order to assess the IDT7026 SEE performance, the SEE prediction and flight validation are performed. The on-orbit Single Event Upset rate for the SRAM IDT7026 is predicted using LET cross-section function fitted from ground SEU experiment data. To validate the prediction result, the flight experiment is carried out for IDT7026 and the on-orbit SEU data is obtained. The flight SEU rate is compared and analyzed with the prediction. The result indicates that the SEU prediction method can give appropriately support to electronic parts on-orbit application and the IDT 7026 can be used in spacecraft with some mitigation methods.

Index Terms—single event upset prediction, LET cross-section, electronic part on-orbit validation

Cite: Jingjing Li, Sipei Shao, Xiaoyun Hao, Yong Liu, and Yutu Zhang, "SRAM IDT7026 SEU Prediction and On-Orbit Validation," Jounal of Automation and Control Engineering, Vol. 4, No. 5, pp. 380-383, October, 2016. doi: 10.18178/joace.4.5.380-383
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